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Scan Test of Die Logic in 3-D ICs Using TSV Probing.
Brandon Noia
Shreepad Panth
Krishnendu Chakrabarty
Sung Kyu Lim
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
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logic programming
data sets
genetic algorithm
computer vision
feature selection
decision trees
case study
database systems
expert systems
evolutionary algorithm
modal logic
statistical tests
classical logic
asynchronous circuits