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A cloud model-based method for the analysis of accelerated life test data.

Wenjin ZhangShunli LiuBo SunYue LiuMichael G. Pecht
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • test data
  • test set
  • training data
  • test cases
  • similarity measure
  • pairwise
  • cross validation
  • distance metric
  • data sets
  • image processing
  • support vector
  • high dimensional
  • support vector machine