Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O.
Amit PandeyBrendan TullyAbhijeet SamudraAjay NagarandalKarthikeyan NatarajanRahul SinghalPublished in: IEEE Des. Test (2023)
Keyphrases
- manufacturing systems
- high speed
- low power
- flexible manufacturing systems
- manufacturing processes
- petri net
- quality control
- manufacturing environment
- production cost
- input output
- complex systems
- manufacturing process
- production rate
- shop floor
- market demand
- control structure
- communication protocol
- genetic algorithm
- holonic manufacturing systems
- hardware and software
- supply chain