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New Non-Scan DFT Techniques to Achieve 100% Fault Efficiency.

Debesh Kumar DasSatoshi OhtakeHideo Fujiwara
Published in: J. Electron. Test. (2004)
Keyphrases
  • discrete fourier transform
  • image processing
  • decision trees
  • objective function
  • control system
  • denoising
  • fault diagnosis