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A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC.

Hideyuki NodaKatsumi DosakaHans Jürgen MattauschTetsushi KoideFukashi MorishitaKazutami Arimoto
Published in: IEICE Trans. Electron. (2006)
Keyphrases
  • embedded dram
  • content addressable
  • random access memory
  • management system
  • real time
  • error correction
  • parallel search
  • design considerations
  • dynamic random access memory
  • high speed
  • peer to peer