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Flip-Flop Selection for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits.
Hsing-Chung Liang
Chung-Len Lee
Published in:
J. Inf. Sci. Eng. (2000)
Keyphrases
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test generation
design automation
user interface
power dissipation
real time
computer vision
circuit design
flip flops
database
case study
high level
video sequences
design process
test cases
static analysis