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Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test.
Ho Fai Ko
Nicola Nicolici
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
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real time
high speed
semi automated
power consumption
test data
scan data
computer vision
artificial intelligence
data sets
training data
evolutionary algorithm
multiresolution
data driven
machine learning
computer aided
statistical significance
real world
processing speed
automated analysis