Re-alignment of Class Images in Single-particle Electron Microscopy.

Wooram Park Gregory S. Chirikjian

Published in: BIOCOMP (2010)

Keyphrases

image processing
electron microscopy
edge detection
image analysis
image registration
x ray
image alignment
three dimensional
image retrieval
image database
low energy
image collections
image stacks
image data
image set
object recognition
multiple images
input image
image matching
image classification
microscopy images
test images
image features
multiple objects
image regions
ground truth
transmission electron microscopy