Functionally Testable Path Delay Faults on a Microprocessor.

Wei-Cheng Lai Angela Krstic Kwang-Ting (Tim) Cheng

Published in: IEEE Des. Test Comput. (2000)

Keyphrases

shortest path
fault diagnosis
high speed
fault detection
special purpose hardware
data sets
design methodology
circuit design
path length
root cause
fault model
destination node