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A built-in test circuit for open defects at interconnects between dies in 3D ICs.

WidiantoHiroyuki YotsuyanagiAkira OnoMasao TakagiMasaki Hashizume
Published in: 3DIC (2011)
Keyphrases
  • real time
  • input output
  • cmos technology
  • real world
  • information systems
  • evolutionary algorithm
  • test data
  • statistical tests
  • circuit design
  • lower cost
  • defect detection