Memory Built-in Self Test in Multicore Chips with Mesh-Based Networks.
Hsiang-Ning LiuYu-Jen HuangJin-Fu LiPublished in: IEEE Micro (2009)
Keyphrases
- integrated circuit
- computing power
- built in self test
- high end
- memory management
- computer systems
- high speed
- complex networks
- computer networks
- network size
- social networks
- computational power
- memory usage
- memory space
- level parallelism
- high density
- cell processor
- heterogeneous networks
- d mesh
- network analysis
- main memory
- network structure
- general purpose