MVP ECC : Manufacturing process variation aware unequal protection ECC for memory reliability.

Seung-Yeob Lee Joon-Sung Yang

Published in: DATE (2017)

Keyphrases

manufacturing process
error correction
process control
quality control
product quality
manufacturing systems
elliptic curve
product design
databases
discrete event
control system
image analysis
real time
information technology
artificial intelligence
error detection
machine learning