A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits.
Zhide ZengJihua ChenPengxia LiuPublished in: Asian Test Symposium (1999)
Keyphrases
- vlsi circuits
- test generation
- test cases
- symbolic execution
- test sequences
- design automation
- parallel processing
- low power
- static analysis
- quality assurance
- real world
- code coverage
- software testing
- shared memory
- artificial intelligence
- mixed signal
- software engineering
- database systems
- computer vision
- learning algorithm
- real time