Measure the Thickness of the Thin-Film Single-Slice-Capacitor.

Changhui Liu Chunmei Xu Le Liu Huahui He

Published in: ISIP (2008)

Keyphrases

thin film
short circuit
film thickness
grain size
high density
similarity measure
multi layer
white light interferometry
management system
decision support system
distance measure
solar cell
database
learning algorithm
electron microscopy
room temperature