Changhui Liu

Publication Activity (10 Years)

Years Active: 2008-2023
Publications (10 Years): 9

Top Topics

Nearest Neighbour

Pattern Recognition

Measurement Data

Misclassification Costs

Top Venues

Int. J. Prod. Res.

IEEE Trans. Instrum. Meas.

Earth Sci. Informatics

Publications

Jianbo Yu, Shijin Li, Xing Liu, Yanfeng Gao, Shijin Wang, Changhui Liu
Dynamic convolutional gated recurrent unit attention auto-encoder for feature learning and fault detection in dynamic industrial processes. Int. J. Prod. Res. 61 (21) (2023)
Caihong Liu, Changhui Liu
Sentiment Analysis of Movie Reviews Based on Sentiment Dictionary and Deep Learning Models. ICRSA (2023)
Changhui Liu, Kun Chen, Sun Jin, Yuan Qu, Jianbo Yu, Binghai Zhou
An integrated method for variation pattern recognition of BIW OCMM online measurement data. Int. J. Prod. Res. 60 (6) (2022)
Ziyan Gui, Changhui Liu, Li Xiong, Zuoquan Xie, Liang Wu
Dynamic Gated Spatial Temporal Graph Neural Networks for Traffic Forecasting. ICBASE (2022)
Changhui Liu, Sun Jin, Donghong Wang, Zichao Luo, Jianbo Yu, Binghai Zhou, Changlin Yang
Constrained Oversampling: An Oversampling Approach to Reduce Noise Generation in Imbalanced Datasets With Class Overlapping. IEEE Access 10 (2022)
Tingda Wu, Chao Li, Xu Xing, Xipeng Pan, Changhui Liu, Yijing Tian, Ziyu Wang, Junshi Zhao, Jianping Wang, Bing He
Straw return and organic fertilizers instead of chemical fertilizers on growth, yield and quality of rice. Earth Sci. Informatics 15 (3) (2022)
Jianbo Yu, Shijin Li, Zongli Shen, Shijin Wang, Changhui Liu, Qingfeng Li
Deep transfer Wasserstein adversarial network for wafer map defect recognition. Comput. Ind. Eng. 161 (2021)
Mengqi Miao, Changhui Liu, Jianbo Yu
Adaptive Densely Connected Convolutional Auto-Encoder-Based Feature Learning of Gearbox Vibration Signals. IEEE Trans. Instrum. Meas. 70 (2021)
Changhui Liu, Kun Chen, Sun Jin, Yuan Qu
Variation Pattern Recognition of the BIW OCMM Online Measurement Data Based on LSTM NN. IEEE Access 7 (2019)
Changhui Liu, Chunmei Xu, Le Liu, Huahui He
Measure the Thickness of the Thin-Film Single-Slice-Capacitor. ISIP (2008)