Deep transfer Wasserstein adversarial network for wafer map defect recognition.
Jianbo YuShijin LiZongli ShenShijin WangChanghui LiuQingfeng LiPublished in: Comput. Ind. Eng. (2021)
Keyphrases
- recognition rate
- recognition accuracy
- object recognition
- recognition algorithm
- peer to peer
- network traffic
- computer networks
- visual recognition
- feature extraction
- integrated circuit
- network model
- defect detection
- recognition process
- network design
- automatic recognition
- image recognition
- communication networks
- active learning
- network structure
- activity recognition
- control system