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Immunity against temperature variability and bias point invariability in double gate tunnel field effect transistor.

Rakhi NarangManoj SaxenaR. S. GuptaMridula Gupta
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • field effect transistors
  • steady state
  • high density
  • mathematical analysis
  • schottky barrier
  • simulation model
  • machine learning
  • chip design
  • neural network
  • information systems
  • wireless sensor networks
  • high speed