mTest: An Industry-Wide Database of VLSI Layouts for Quality Control.
Anand Pramod KulkarniThomas J. GrebinskiPublished in: ISQED (2006)
Keyphrases
- quality control
- database
- machine vision
- databases
- manufacturing systems
- quality assurance
- database systems
- signal processing
- database management systems
- data model
- case study
- manufacturing process
- relational databases
- wide range
- computer vision
- quality improvement
- data management
- world wide
- automated visual inspection