An efficient method for generating exhaustive test sets.
Ted StanionDebashis BhattacharyaCarl SechenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)
Keyphrases
- test data
- test set
- high accuracy
- detection method
- high precision
- segmentation method
- generation method
- computational complexity
- computationally efficient
- dynamic programming
- multiscale
- similarity measure
- computational cost
- edge detection
- genetic algorithm
- support vector machine svm
- segmentation algorithm
- synthetic data
- cost function
- test cases
- prior knowledge
- feature selection