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Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories.
Shyue-Kung Lu
Cheng-Ju Tsai
Masaki Hashizume
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
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failure rate
embedded systems
high density
digital images
high speed
integrated circuit
database
artificial intelligence
multiscale
information processing
reliability assessment