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Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories.

Shyue-Kung LuCheng-Ju TsaiMasaki Hashizume
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
  • failure rate
  • embedded systems
  • high density
  • digital images
  • high speed
  • integrated circuit
  • database
  • artificial intelligence
  • multiscale
  • information processing
  • reliability assessment