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d-electron count, ion-pairing and diagonal twist angles in metallo-bis(dithiolene) complexes.

Charles C. KirkpatrickJohn N. TruongBruce A. Kowert
Published in: J. Comput. Chem. (2017)
Keyphrases
  • high energy
  • covariance matrix
  • electron beam
  • aggregation functions
  • critical points
  • electron microscopy
  • social networks
  • bayesian networks
  • electron beam lithography
  • metal oxide