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Novel high-resolution sidewall imaging using standard Atomic Force Microscopy equipment: Exceeding surface scanning using customized FIB-milled AFM tips in torsional feedback mode.
Florian Krohs
Sergej Fatikow
Published in:
ICST (2013)
Keyphrases
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atomic force microscopy
high resolution
image processing
low resolution
three dimensional
d objects
surface reconstruction
scanning devices
high quality
relevance feedback
search engine
image segmentation
satellite images
high resolution images
laser scanner