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A Test Module for Aging Characterization of Digital Circuits.

Jose M. Gata-RomeroAndrés Santana-AndreoElisenda RocaRafael Castro-LópezFrancisco V. Fernández
Published in: SMACD (2023)
Keyphrases
  • digital circuits
  • data flow
  • model based diagnosis
  • test data
  • face recognition
  • test cases
  • statistical significance
  • evolvable hardware