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Generation of Tests for the Localization of Single Gate Design Errors in Combinational Circuits using the Stuck-at Fault Model.
Raimund Ubar
Dominique Borrione
Published in:
SBCCI (1998)
Keyphrases
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fault model
case study
design process
circuit design
analog circuits
logic synthesis
control system
mobile robot
localization error
fault models
high level synthesis