Quantum artificial vision for defect detection in manufacturing.
Daniel GuijoVictor OnofreGianni Del BimboSamuel MugelDaniel EstepaXabier De CarlosAna AdellAizea LojoJosu BilbaoRoman OrusPublished in: CoRR (2022)
Keyphrases
- defect detection
- artificial vision
- vision system
- object recognition
- computer vision
- quantum computing
- manufacturing systems
- manufacturing processes
- feature extraction
- textured surfaces
- quality control
- automated visual inspection
- quantum computation
- production planning
- manufacturing environment
- quantum inspired
- production line
- real time
- data sets
- probability ranking principle
- cell formation
- manufacturing industry
- semiconductor manufacturing
- industrial engineering
- automotive industry
- concurrent engineering
- material handling
- petri net
- quantum evolutionary algorithm