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Integration of Hard Repair Techniques with ECC for Enhancing Fabrication Yield and Reliability of Embedded Memories.

Shyue-Kung LuCheng-Ju TsaiMasaki Hashizume
Published in: ATS (2015)
Keyphrases
  • failure rate
  • error correction
  • data sets
  • integrated circuit
  • high density
  • error detection
  • information integration
  • relational databases
  • elliptic curve
  • error correcting
  • consistent query answering