Prototyping of Beam Shaping Diffraction Gratings by AFM Nanoscale Patterning.
Lo Ming FokYun-Hui LiuWen Jung LiPublished in: IEEE Trans Autom. Sci. Eng. (2010)
Keyphrases
- atomic force microscopy
- x ray
- signal processing
- electron beam
- rapid prototyping
- long period
- transmission electron microscopy
- cross section
- infrared
- integrated circuit
- development process
- computer vision
- databases
- pattern recognition
- phased array
- medical images
- relational databases
- electron microscopy
- information systems
- reward shaping
- real world
- neural network