A Probabilistic and Constraint Based Approach for Low Power Test Generation.
Hossein Sabaghian BidgoliMajid Namaki-ShoushtariZainalabedin NavabiPublished in: Asian Test Symposium (2012)
Keyphrases
- low power
- test generation
- power consumption
- low cost
- high speed
- test cases
- low power consumption
- static analysis
- design automation
- single chip
- high power
- software testing
- vlsi architecture
- digital signal processing
- image sensor
- quality assurance
- wireless transmission
- gate array
- vlsi circuits
- real time
- logic circuits
- power dissipation
- cmos technology
- mixed signal
- software development
- power reduction
- delay insensitive
- video sequences
- artificial intelligence
- nm technology
- data sets