Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits.
Barry John MuldreySabyasachi DeyatiAbhijit ChatterjeePublished in: ATS (2016)
Keyphrases
- analog circuits
- optimization problems
- optimization algorithm
- automatic detection
- false alarms
- constrained optimization
- detection algorithm
- digital circuits
- fault diagnosis
- wavelet packet transform
- defect detection
- detection accuracy
- optimization process
- false positives
- detection method
- genetic algorithm
- optimization method
- machine learning