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Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash.
Weihua Liu
Fei Wu
Meng Zhang
Yifei Wang
Zhonghai Lu
Xiangfeng Lu
Changsheng Xie
Published in:
DATE (2019)
Keyphrases
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power system
power supply
highly reliable
reliability analysis
electric power systems
charge coupled device
metal oxide
threshold selection
adaptive threshold
databases
genetic algorithm
flash memory
foreseeable future
duty cycle