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An infrastructure for accurate characterization of single-event transients in digital circuits.

Varadan Savulimedu VeeravalliThomas PolzerUlrich SchmidAndreas SteiningerMichael HofbauerKurt SchweigerHorst DietrichKerstin Schneider-HornsteinHorst ZimmermannKay-Obbe VossBruno MerkMichael Hajek
Published in: Microprocess. Microsystems (2013)
Keyphrases
  • digital circuits
  • event detection
  • model based diagnosis
  • multi channel
  • computationally efficient
  • evolvable hardware
  • high quality
  • np complete
  • information exchange
  • decision diagrams