Logic Testing of Bridging Faults in CMOS Integrated Circuits.

Brian Chess Tracy Larrabee

Published in: IEEE Trans. Computers (1998)

Keyphrases

built in self test
integrated circuit
metal oxide semiconductor
test cases
high speed
delay insensitive
fault model
low power
power supply
electron beam
low voltage
analog vlsi
circuit design
chip design
random access memory
software systems
low cost