Datapath BIST Insertion Using Pre-Characterized Area and Testability Data.
Jiang Chau WangPaulo Sérgio CardosoJose Artur Quilici GonzálezMarius StrumRicardo PiresPublished in: J. Electron. Test. (2004)
Keyphrases
- data sets
- data collection
- data structure
- missing data
- training data
- data analysis
- data processing
- synthetic data
- database
- high quality
- data mining techniques
- image data
- sensor data
- data distribution
- raw data
- complex data
- small number
- input data
- data sources
- high dimensional data
- test cases
- machine learning
- test data
- missing values
- original data