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SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts.

Sujay PandeyZhiwei LiaoShreyas NandiSanya GuptaSuriyaprakash NatarajanArani SinhaAdit D. SinghAbhijit Chatterjee
Published in: ITC (2020)
Keyphrases
  • image analysis
  • statistical analysis
  • quantitative analysis
  • databases
  • neural network
  • data analysis
  • pattern matching
  • automatically generated
  • randomly generated
  • automated analysis