Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults.

Walter M. Lindermeir Thomas J. Vogels Helmut E. Graeb

Published in: DATE (1998)

Keyphrases

circuit design
experimental design
built in self test
building blocks
computer aided
false alarms
statistical tests
design principles
event detection
false positives
test cases
detection method
object oriented
case study
data sets
database
design process
computer vision
digital computer
printed circuit