Login / Signup
Robust Line Matching Based on Ray-Point-Ray Structure Descriptor.
Kai Li
Jian Yao
Xiaohu Lu
Published in:
ACCV Workshops (1) (2014)
Keyphrases
</>
feature descriptors
ray tracing
scale and rotation invariant
scale invariant feature transform
feature points
keypoints
matching algorithm
feature matching
object recognition
image matching
wide baseline matching
multiscale
integral image
feature extraction
single image
local binary pattern