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An edge-from-focus approach to 3D inspection and metrology.
Fuqin Deng
Jia Chen
Jianyang Liu
Zhijun Zhang
Jiangwen Deng
Kenneth S. M. Fung
Edmund Y. Lam
Published in:
Image Processing: Machine Vision Applications (2015)
Keyphrases
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feature extraction
information systems
camera calibration
machine vision
process control
visual inspection
disjoint paths