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FinFET and MOSFET preliminary comparison of gate oxide reliability.

Raul FernándezRosana RodríguezMontserrat NafríaXavier AymerichBen KaczerGuido Groeseneken
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • machine learning
  • real time
  • database
  • data mining
  • information systems
  • multiscale
  • artificial neural networks
  • leakage current