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Cellular automata-based test pattern generators with phase shifters.
Grzegorz Mrugalski
Janusz Rajski
Jerzy Tyszer
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
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pattern matching
cellular automata
test cases
data generator
information retrieval
face recognition
bayesian networks
statistical tests
data mining
three dimensional
training data
pattern discovery
statistical significance
training phase
similar patterns