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Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides.
Alain Bravaix
Didier Goguenheim
Nathalie Revil
E. Vincent
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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cmos technology
distributed systems
high speed
computer systems
retrieval systems
low power
information systems
building blocks
complex systems
power consumption
high density
nm technology