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A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories.
Paolo Bernardi
Maurizio Rebaudengo
Matteo Sonza Reorda
Massimo Violante
Published in:
DATE (2003)
Keyphrases
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built in self test
low cost
digital signal processors
databases
database systems
general purpose
statistical tests
statistical significance
data sets
real world
website
high speed
power consumption