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An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults by Incrementally Extending the Test Patterns.
Peikun Wang
Amir Masoud Gharehbaghi
Masahiro Fujita
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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generation method
fully automatic
real time
semi automatic
candidate patterns
genetic algorithm
expert systems
test cases
database
test data
machine learning
pattern discovery
model based diagnosis
statistical significance
real world
neural network
pattern representation