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An asynchronous algorithm for sequential circuit test generation on a network of workstations.

James SienickiMichael L. BushnellPrathima AgrawalVishwani D. Agrawal
Published in: VLSI Design (1995)
Keyphrases
  • learning algorithm
  • np hard
  • matching algorithm
  • test generation
  • artificial intelligence
  • computer vision
  • image processing
  • k means
  • test cases
  • manufacturing systems