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An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits.
Noriyoshi Itazaki
Yasutaka Idomoto
Kozo Kinoshita
Published in:
Asian Test Symposium (1997)
Keyphrases
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expert systems
generation method
built in self test
test cases
fuzzy logic
feature generation
integrated circuit
real time
high speed
database
clustering algorithm
model based diagnosis
sequential data
digital circuits
asynchronous communication
sequential search