A packet address driven test strategy for stuck-at faults in networks-on-chip interconnects.

Biswajit Bhowmik Santosh Biswas Jatindra Kumar Deka

Published in: MED (2015)

Keyphrases

built in self test
test cases
fault diagnosis
integrated circuit
low cost
high speed
high bandwidth
network design
neural network
input output
complex networks
telecommunication networks
power dissipation
internet protocol
switched networks