Fine grain faults diagnosis of FPGA interconnect.

T. Nandha Kumar Haider A. F. Almurib New Chin-Ee

Published in: Microprocess. Microsystems (2013)

Keyphrases

fine grain
fault diagnosis
coarse grain
model based diagnosis
fault detection
multiple faults
high speed
reconfigurable hardware
fault model
parallel computation
hardware implementation
distributed memory
field programmable gate array
nested transactions
low cost
database
parallel algorithm