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Analysis and experimental verification of digital substrate noise generation for epi-type substrates.
Marc van Heijningen
John Compiet
Piet Wambacq
Stéphane Donnay
Marc Engels
Ivo Bolsens
Published in:
IEEE J. Solid State Circuits (2000)
Keyphrases
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experimental verification
statistical analysis
quantitative analysis
data analysis
real time
high resolution
image enhancement
noisy data
noise reduction
additive noise