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Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs.

Anjela Yu. MatrosovaEkaterina LoukovnikovaSergei OstaninAlexandra ZinchukEkaterina Nikolaeva
Published in: DFT (2007)
Keyphrases
  • test generation
  • test cases
  • mutation testing
  • data sets
  • databases
  • design automation
  • database
  • machine learning
  • decision trees
  • relational databases
  • high speed
  • quality assurance
  • symbolic execution