Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs.
D. GhoshDavid C. Tou WeiPublished in: ACCV (2) (2006)
Keyphrases
- pattern spectrum
- textural features
- texture analysis
- pattern spectra
- local binary pattern
- texture features
- texture descriptors
- multiresolution
- texture classification
- gray level
- image analysis
- mathematical morphology
- multiscale
- texture images
- feature extraction
- binary images
- co occurrence
- structuring elements
- shape representation
- face recognition
- visual inspection
- machine learning
- morphological operations
- classification accuracy