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MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits.

Takuji OgiharaK. MuroiGenichi YonemoriShinichi Murai
Published in: DAC (1989)
Keyphrases
  • test generation
  • test cases
  • data sets
  • databases
  • cost effective
  • computer vision
  • software testing
  • symbolic execution
  • database
  • information systems
  • object oriented
  • high speed
  • machine vision